| 圖 片 |
設(shè)備名稱 |
制造商 |
型號(hào) |
年份 |
詳細(xì)配置 |
狀 態(tài) |
 |
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2006 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2006 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2006 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2006 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2006 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2004 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2006 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2005 |
BU: Test/Sort, Tool Condition: Do |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2006 |
BU: Test/Sort, Tool Condition: Do |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2006 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2006 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2005 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2005 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2005 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2005 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2005 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2004 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2004 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2005 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2004 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS II ATE探針臺(tái) |
SEMICS |
OPUS II |
2004 |
BU: Test/Sort, Tool Condition: Fu |
國外
|
|
SEMICS OPUS3 PROBER探針臺(tái) |
SEMICS |
OPUS3 |
- |
4 SET |
國外
|
|
SEMICS MP700-75探針臺(tái) |
SEMICS |
MP700-75 |
- |
3 SET |
國外
|
|
SEMICS OPUS2探針臺(tái) |
SEMICS |
OPUS2 |
- |
1 SET |
國外
|
|
SEMICS OPUS2 MANIPULATOR探針臺(tái) |
SEMICS |
OPUS2 MANIPULATOR |
- |
1 SET |
國外
|
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